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 Poly-Flow Eng. announces two low-cost tools of their renowned line of cleaning systems both featuring improved cleaning performances
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The HTC-8030 offers exceptional cleaning performance and flexibility. Dynamic spray/dry, coupled with product specific baskets allow for the cleaning and drying of any type and size of carrier cleaner. User-friendly touch-screen operation and low cost purchase and ownership.
The newly reduced price makes this tool the lowest cost carrier cleaner available.
The FX-60 FOUP/FOSB cleaner combines a high level of cleaning and drying performance with over 80 installations worldwide. The highest purity materials are used in the cleaning chamber which allows for liquid particle count performance <100 at 0.2 um.
Now the lowest priced 300mm FOUP/FOSB cleaner on the market.
For further information on the Poly-Flow product line, please contact
us, or consult our page Cleaning
Systems.
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XYZ Mapping Table for Resistance & Thickness Measurements of Thin-Film Solar Panels
Specially conceived for measuring resistance & thickness on thin-film solar panels, the model RG-09 mapping XYZ table is used off-line during the process of thin film PV Silicon production.
Automated mapping measurements of sheet resistance of the first and second TCO-layers by
Four Point Probe Measurements and thickness of the a-Si-layer by Reflection Spectrometer.
Standard table size is 1100mm x 1300mm, manual or automated loading, vertical or horizontal setup. Complete turnkey system. |
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New Representation: Reedholm DC Parametric Testers
Reedholm provides many measurement solutions for electrical test structures and simple functional devices. Reedholm systems are used in process control, production E-Test, wafer level and packaged level reliability testing, plus custom ATE applications.
For more information please contact
us. |
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USB Control of Mercury Probes
The new Model 802C MERCURY PROBE from MDC features a USB interface for computer control of the contact and purge operations.
This new feature increases the repeatability of the probe because these formerly manual functions are now under software control.
In addition, zeroing and sensing of device contact are completely automatic so operator-dependent actions are reduced.
The Model 802C MERCURY PROBE becomes the most convenient and reliable probe offered by MDC since it introduced the mercury probe over 30 years ago.
For
more information see our page Mercury Probes
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MDC CSM/Win Software Controls Keithley 4200
The MDC CSM/Win Semiconductor Analysis Software is now available with a Keithley 4200 Semiconductor Characterization System.
The combination of MDC software and Keithley hardware makes one of the most powerful and versatile capacitance-voltage and current-voltage measurement systems available today.
The MDC software augments the basic Keithley software with many advanced measurement and analysis functions developed by MDC.
This broadens the range of users for the 4200 SCS to production and specialized measurement applications.
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Photovoltaic Four Point Probe system
The reliable and cost-effective Four
Point Resisitivity Mapping System CMT-SR2000 from
A.I.T. has been upgraded to suit
photovoltaic applications with square samples up to 156mm.
For
more information see our page Mapping Four Point Probe
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