MDC is your best source for advanced and versatile C-V plotting systems and associated measurement techniques.

   C-V MEASUREMENT SYSTEM

The CSM/WIN Computerized Semiconductor C-V Measurement System runs under the powerful Windows 95/98/NT/2000 operating systems with a complete selection of advanced C-V measurements and analysis software packages.

The CSM/WIN System covers all needs from basic Production C-V measurement to sophisticated units offering Engineering measurement functions and analysis such as:

     Mobile Ions: CVBT & TVS methods
     Thin Oxides: Frequency switching for leaky     oxides, Ricco analysis. Quantum mechanical and     poly depletion effects for ultra thin oxides (<100A)
     I-V and Gate Oxide Integrity Tests: 
    TZBD, JT, TDDB, QBD, Fowler-Nordheim analysis,     multiple oxide integrity tests for automatic prober.
     Dielectric Constant:
    For both low-k and high-k
     Lifetimes:
    Zerbst analysis with automatic selection
     Doping Profiles:
    MOS and Junction
     Interface Trap Density (Dit):
    Variable frequency - conductance method,     
    quasi-static and high frequency method
     Copper Diffusion Tests
    TFT Tests 


MDC carefully integrates all instruments, probe stations, multiplexers, and software into fully operational systems that feature the largest choice of proven measurement and analysis functions.

For customers who have their own hardware, MDC offers complete software packages to unify the equipment into a semiconductor measurement powerhouse.

The CSM/Win Measurement System family includes over one hundred different instrument configurations.

–› Download C-V and I-V Systems datasheet .pdf


› More on C-V / I-V Systems on MDC USA website