PC based systems
Specialized Software:
- Intranet & DOS offerings
- Build: Test plan creation & probing patterns
- Acquire: Production testing
- Examine: Graphical Data Analysis
Rich Array of Test Types
- Virtually eliminate programming
- Inputs/Outputs stored in SQL database or ASCII
Distributed Processing
- Low cost Windows PCs w/Intranet offering
- Embedded DOS PC for quality data acquisition
- Easily networked
 Applications
A variety of system software packages enable Reedholm test systems to satisfy the different semiconductor test applications they are used for.
This includes:
- End-of-line process monitoring and yield management (E-Test)
- In-line process monitoring and reliability (Fast WLR, GOI, PID)
- Slow wafer and packaged level reliability (EM, HCI, TDDB)
- dc functional test of sensors, diodes, CCDs, capacitors, etc.
- Specialty testing, such as NVM stressing, CHARM wafers, high voltage breakdown, etc.
Because Reedholm systems are so reliable and durable, working life extends well beyond the market life of competitive offerings. Several Reedholm customers keep 20 year old systems working at state-of-the art performance. All they have had to do is make a few hardware and software upgrades that cost a small fraction of what it would take to buy a new system.
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