Since 1983, Reedholm has focused on dc test systems used by semiconductor manufacturers to make measurements on electrical test structures.
Because of the broad application of test structures, our test systems help assure quality and reliability in process development, wafer acceptance testing, and reliability evaluation.
 DC Parametric Test System
Reedholm test systems are primarily used for in-line and end-of-line collection of dc test data. In these applications, test structures are measured while in wafer form with an automatic prober used for volume testing. Similar applications makes dc and capacitance measurements on individual transistors, diodes, and sensors.
Reliability System
Oxide Wearout -TDDB
Device Degradation – HCI
Electromigration
Custom Systems
wafer Level Test System
Process Control - E Test
Device Characterization
Wafer Level Reliability
Charge Damage Assement
DC Final Test
Custom ATE
pc based system
Specialized Software:
- Intranet & DOS offerings
- Build: Test plan creation & probing patterns
- Acquire: Production testing
- Examine: Graphical Data Analysis
Rich Array of Test Types
- Virtually eliminate programming
- Inputs/Outputs stored in SQL database or ASCII
Distributed Processing
- Low cost Windows PCs w/Intranet offering
- Embedded DOS PC for quality data acquisition
- Easily networked
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