Wafer level test systems


The optional Fast WLR test routines augment the standard EMPAC or Build routines and are designed for specific test structures, which Reedholm can also provide.
The routines provide the shortest possible test times, while accelerating the primary failure mechanisms. 
Careful control of the stress variables and the ability to trap any possible error condition provide high quality test results. 
Extensive graphical outputs are provided during initial test setup in order to evaluate test structures and conditions.