Materials Development Corp. SA
     
 

  •  Hot chucks
  •  Copper diffusion probe
  •  Cryogenic probe

  • Manual 4 point probe
  • Mapping 4 point probe
  • 4 point probe heads
  • Non contact

  • P
  • P
  • Entegris

 

 
 
PROBE STATIONS  



Hot Chucks

Probe stations to suit all measurement requirements whether production, engineering or research.

  QuietCHUCK System

Basic Hot Chuck System: Complete set of components required for mobile ion measurements by conventional bias-temperature stress technique (CVBT) or triangular voltage sweep method (TVS) using the MDC QuietCHUCK DC Hot Chuck Controller.
The CSM/WIN System can control and monitor all stress parameters. Multiplexing of up to 10 probes available.


–› Download quiet chuck datasheet .pdf

  DuoCHUCK Chuck System

The DuoCHUCK Integrated Hot Chuck System: Designed for high throughput CVBT mobile ion tests. Contains two hot chucks and all associated control, multiplexing, and stress bias circuitry to make measurements on one to five C-V dots on each chuck.
The DuoCHUCK has 10 times the capacity of a conventional single dot probe station.

–› Download Duo chuck datasheet .pdf

  Autoloading Hot Chuck

For multiple site measurements. Facilitates mapping of parameters like Vfb, lifetime, oxide integrity, or interface trap density. Special prober software includes expanded multiple test menus, data storage and statistical analyses.

–› Download autoloading hot chuck datasheet .pdf

 
 
 
 
 
 
 
     
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