Mapping Four Point Probes

AIT Advanced Instrument Technology manufactures Automatic 4 Point probe systems for sheet resistance and resistivity measurements. Developed with the Korean Institute of Standards.

Model CMT SR2000N

The CMT-SR2000N is a fully automatic system to measure Sheet Resistance and Resistivity of Silicon Wafer up to 8".
This system can be operated by itself, furthermore, perfect remote control is available using a PC and exclusive software, and it gives various data analyses.

 Model CMT SR3000

The CMT-SR 3000 is a measurement system for Sheet Resistance and Resistivity of a plain rectangle sample such as LCD, ITO, TFT up to 600x720mm
And it is designed to work for remote functioning to meet automation such as automatic sample loading.
This system is designed for easy operation by a personal computer with exclusive software, and this software has function for various data analyses, mapping and etc.

 Model CMT SR5000

The CMT-SR5000 is a high precision system equipped to measure the Sheet Resistance and Resistivity of Silicon Wafer up to 12".
This system is designed for easy operation by a personal computer with exclusive software, and this software has function for various data analyses mapping and etc.

Mapping Software

Ex : CMT SR2000N / SR5000 :