Mapping four point probes
for
Photovoltaic samples & flat panels
 Model CMT-SR2000PV
| Measures sheet resistance (ohm/sq), resisitvity (ohm.cm),
calculated thickness of wafers |
| PC remote control with exclusive software under Windows |
| Software for round and square samples |
Automatic range selection, LCD display.
Data export under Excel |
| Contour map, 2 & 3-dimension maps, trend chart analyses |
Predefined measurement ASTM and SEMI modes,
Cartesian mode, manual mode and customized patterns |
| Comes with quality, easy removable, probe head with various specifications |
| Measurement area up to 156mm square or 230mm round |
Convenient table top stand-alone system.
Easy to use |
Metal housing with cover on hinges. |
–› Download
CMT-SR2000 datasheet
Model CMT-SR3000
| Measures sheet resistance (ohm/sq), resisitvity (ohm.cm), on flat panels such as LCD, ITO, TFT, thin films,
solar cells, fuel cells |
Three models with different size sample stages:
| Small: |
370 x 470 mm |
| Medium: |
550 x 650 mm |
| Large: |
600 x 720mm |
|
| PC remote control with exclusive software under Windows |
Full remote control (movement, measurement, home position)
Bridge type with true linear X-Y-Z probe head movement |
| Data map, contour map, 2 & 3-dimension maps, trend chart analyses |
Predefined measurement ASTM and SEMI modes,
9, 13, 25 pattern quick mode, manual mode and customized patterns |
| Comes with quality, easy removable, probe head with various specifications |
| LED for process signal, glass centering nob. |
Convenient table top anti static system.
Easy to use. |
–› Download
CMT-SR3000 datasheet
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