Mapping Four Point Probes
AIT Advanced Instrument Technology manufactures Automatic 4 Point
probe systems for sheet resistance and resistivity measurements.
Developed with the Korean Institute of Standards.
 Model CMT SR2000N
The CMT-SR2000N is a fully automatic system to
measure Sheet Resistance and Resistivity of Silicon Wafer up to
8".
This system can be operated by itself, furthermore, perfect remote
control is available using a PC and exclusive software, and it
gives various data analyses.
Model CMT SR2000-PV
The CMT SR2000-PV is the photovoltaic dedicated version
of the CMT-SR2000N.
This instrument was developed to suit
photovoltaic applications with square samples up to 156mm.
Model
CMT SR3000
The CMT-SR 3000 is a measurement system for Sheet
Resistance and Resistivity of a plain rectangle sample such as
LCD, ITO, TFT up to 600x720mm
And it is designed to work for remote functioning to meet automation
such as automatic sample loading.
This system is designed for easy operation by a personal computer
with exclusive software, and this software has function for various
data analyses, mapping and etc.
Model
CMT SR5000
The CMT-SR5000 is a high precision system equipped
to measure the Sheet Resistance and Resistivity of Silicon Wafer
up to 12".
This system is designed for easy operation by a personal computer
with exclusive software, and this software has function for various
data analyses mapping and etc.
Mapping Software
Ex : CMT SR2000N / SR5000 :
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