Non Contact

PN Tester

The hand-held battery operated P/N tester is suitable for non contact conduction type determination of silicon samples above 20mOhmcm.
Sample identification is shown by the color of the LED.

• Resistivity range 20mOcm to 3000Ocm
• Measurement time ~0.5s


RT-100 Resistivity tester
   for blocks, ingots and feedstock material

• Resistivity range 0.01-20 Ocm
• Measurement time ~ 1s
• Computer controlled operation
• No sample preparation

OPTIONS:
Probe head for p/n testing


RT-110 Resistivity tester for wafer

• Resistivity range 0.01-20 Ocm
• Measurement time ~ 1s
• Computer controlled operation
• No sample preparation

OPTIONS:
Wafer Thickness Measurement in the range of 200 to 1000 µm
Probe for p/n testing