C-V and I-V Measurement Systems
MDC is THE choice for your Capacitance VS Voltage (CV) Measurements, and much more.
| The CSM/WIN Computerized Semiconductor C-V Measurement System runs under the powerful Windows 95/98/NT/2000 operating systems with a complete selection of advanced C-V measurements and analysis software packages. |  |
The CSM/WIN System covers all needs from basic Production C-V measurement to sophisticated units offering Engineering measurement functions and analysis such as:
Mobile Ions: CVBT & TVS methods
Thin Oxides: Frequency switching for leaky oxides, Ricco analysis. Quantum mechanical and poly depletion effects for ultra thin oxides (<100A)
I-V and Gate Oxide Integrity Tests:
TZBD, JT, TDDB, QBD, Fowler-Nordheim analysis, multiple oxide integrity tests for automatic prober.
Dielectric Constant:
For both low-k and high-k
Lifetimes:
Zerbst analysis with automatic selection
Doping Profiles:
MOS and Junction
Interface Trap Density (Dit):
Variable frequency - conductance method,
quasi-static and high frequency method
Copper Diffusion Tests
TFT Tests
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MDC carefully integrates all instruments, probe stations, multiplexers, and software into fully operational systems that feature the largest choice of proven measurement and analysis functions. For customers who have their own hardware, MDC offers complete software packages to unify the equipment into a semiconductor measurement powerhouse. |
The CSM/Win Measurement System family includes over one hundred different instrument configurations.
For measurements at different temperatures (from 80K to 500K), the MDC cryogenic station is the instrument you are looking for.
Visit the MDC USA site.
