Non-contact Analysis and Measurements
You can find what suits your needs in our complete range of instruments for optical analysis. From the portable and ready-to-use SpectraAcademy spectrometer to powerful optical defects analyser, K-Mac instruments offer flexibility and fiability to LED Processes, OLED and Semiconductor Fabrication Lines.
K-Mac instruments can be used for a large number of applications: thin-film thickness measurement - color measurement - 3D interferometer - vision inspection.
Spectrometers, Ellipsometers, Reflectometers, Interferometers, Particle Counters: discover the K-Mac product line. Download their catalogue now!.
![]() |
- Non-contact, non-destructive methods - Fast measurements - High repeatability and reproducibility |
Visit K-Mac's website
