Product Lines

C-V I-V Systems

MDC cryogenic station

Mercury Probes

Resistivity - Thickness Measurements

Probe Heads

Quartzware and wafers

DC-Testing Systems

Optical Spectrometers

Quality Refurbishing

Cleaning Systems

Cleanroom equipment and consumables

X-Ray Metrology thin-films

Non-contact Analysis and Measurements

 

You can find what suits your needs in our complete range of instruments for optical analysis. From the portable and ready-to-use SpectraAcademy spectrometer to powerful optical defects analyser, K-Mac instruments offer flexibility and fiability to LED Processes, OLED and Semiconductor Fabrication Lines.

K-Mac instruments can be used for a large number of applications: thin-film thickness measurement - color measurement - 3D interferometer - vision inspection.

Spectrometers, Ellipsometers, Reflectometers, Interferometers, Particle Counters: discover the K-Mac product line. Download their catalogue now!.

KMac Optical Analysis and Defect Analysis Equipment

- Non-contact, non-destructive methods

- Fast measurements

- High repeatability and reproducibility

 

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