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Automatic Mapping Four Point Probe Resistivity Measurements

Square & Round wafers mapping systems with different types of platform sizes. Measurement of resistivity, sheet resistance and calculate coating thickness. Completely integrated systems, direct indication of the calculed thickness, powerful graphical output of the results. Possible to measure over 5000 points on wafers overnight.

Benefits

  • Measurement efficiency , consistency
  • Adapted for Wafer and Solar application
  • Reproducibility
  • Cost reduction

Equipments:

CMT-SR2000N

The entry-level model of the AIT four point measuring systems family.

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CMT-SR2000N

The CMT SR2000 is a completely automated, mapping four point measuring system. It offers precise and fiable mapping measurements of resistivity and sheet resistance.

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CMT-SR3000

Sheet Resistance & Resistivity Measuring System (Four Point Probe System for Glass).

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CMT-SR5000

Sheet Resistance & Resistivity Measuring System (Four Point Probe System for 12" Wafer).

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Probe Heads:

Miniature Catridge Four Point Probe Head

PRECISION 4-POINT RESISTIVITY PROBE HEADS

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