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Four Point Probe Heads

Different models (new, refurbished and repaired) to fit all known resistivity measurement systems (prometrix, CDE, KLA, Napson, Veeco) Customized probe spacing, load, tip material. Probe Spacing : 0.5 / 0.635 / 1.0 / 1.59 mm - Loads : 10 to 250 g.

Benefits

  • Surface access measures resistance, thickness
  • Adapted stations support specific metrology needs
  • Operator efficiency and cost reduction

Probe Heads:

Compact Probe Head

For use on Veeco FPP50000 and FPP100 equipment. It is also suitable for use on GRQ equipment or to replace square bodied probe heads manufactured by Alessi.

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Cylindrical Four Point Probe Head

Jandel Engineering Limited manufactures the cylindrical four point probe head to be compatible with the Jandel Multiposition Wafer Probe, the Microposition Probe, the Multiheight Probe, The Multiheight/Microposition Probe, as well as some OEM mapping systems.

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Hand Applied Four Point Probe

A solution for making measurements where portability is a key factor. The system can be used for measuring a wide variety of samples from thin layers and wafers up to large ingots. The probe head can have loads of up to 200g per needle and the Hand Applied Probe has a large downward force of around...

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Probes for Prometrix KLA/Tencor

Manifactured with 6-way connector probe head to be compatible with systems manufactured by KLA/ Tencor (formerly Prometrix).

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Probes for Prometrix CDE

Manufactured with 6-way connector probe head to be compatible with systems manufactured by CDE, Creative Design Engineering

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Miniature Catridge Probe Head with Positioning Key

Manufactured with positioning key for use on older Napson and Kokusai equipment.

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Miniature Catridge Probe with 6-32/M3 Mounting Holes

For use on AIT equipment. The 6-32 or M3 mounting holes also make it suitable for use in customers’ own stands.

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Catridge with lead Probe Head

For use on customer ’s own equipment, some Veeco equipment, or where an A&M Fell style probe has previously been used.

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Catridge Probe With 4-Pin Connector Mounting

For use on Napson equipment or older Keithley-Omega equipment.

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Low Profile Probe for Hall Measurements

For use in making four point probe measurements associated with Hall measurements.

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Macor Probe

For use at high or low temperatures. The range the probe can be used in an oven is approximately 80K to 600K. If the sample only is heated the probe can be used for measurements up to 1000K although prolonged contact with the sample should be avoided.

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Hi-Vac Cylindrical Four Point Probe Head

A version of the cylindrical probe which can be used at high vacuum.

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