Full range of systems for the optical analysis of thin film, wafers and solar cells, ranging from thickness measurements to 3D profiling to colour measurement. Completely integrated systems, wide range of models & prices, non-destructive measurements. From R&D to the product lines, each application will find its specific instrument: semiconductor, biotech, solar, LCD.
Optical Measurements Systems
- Optical, non-destructive, non-contact
- Real sample monitoring
- Fast Measurement (400 points / 40 sec)
- Easy operation / Auto-focusing
- 2D & 3D Mapping