Silicon wafer flatness, Transparent film on transparent substrate, Thin film thickness 3D Profilometry…
Applications:
– Silicon wafer flatness
– Transparent film on transparent substrate
– Thin film thickness 3D Profilometry
– Solar cell inspection
Features:
– 150mm X-Y stages with adjustable height up to 200mm,
– Sub nanometer range with optical video zoom and AFM integration
– Quality control options
Benefits:
– High speed profiling due to chromatic confocal line sensors
– 3D graphics and auto video scan
– Wide range of samples with varying geometries
– High magnification microscopy combined with other properties
– Custom configurations
