Fast Measurement & Easy Operation Non-contact & Non-destructive Superb Repeatability & Reproducibility Windows based user-friendly interface Print function of each view & data saving.
ST-2000
Features
Fast Measurement & Easy Operation
Non-contact & Non-destructive
Superb Repeatability & Reproducibility
Windows based user-friendly interface
Print function of each view & data saving
Up to 3 layer measurement
Application
Polymers : PVA, PET, PP, PR & etc Dielectrics : SiO2, TiO2, ZrO2, Si3N4 & etc Semiconductors : Poly-Si, GaAs, GaN, InP, ZnS & etc.
Specification & Features
Measurement range – 200Å ~ 35 ㎛ (Depends on film)
Measurement speed – 1~2 sec/site
Stage size – 150 X 120mm, (70 X 50 mm Movement)
Measuring sample size – ≤ 4”
Spot size – 20 ㎛ Typically
Measurement principle – Reflectometer
Measurement method – Non-contact
Type – Manual
Dimension – 190 x 265 x 316 mm
Weight – 12Kg
Head – Trinocular Head
12v 35w Halogen lamp built-in control device & transformer
