Optical Measurements Systems

Full range of systems for the optical analysis of thin film, wafers and solar cells, ranging from thickness measurements to 3D profiling to colour measurement. Completely integrated systems, wide range of models & prices, non-destructive measurements. From R&D to the product lines, each application will find its specific instrument: semiconductor, biotech, solar, LCD.

Benefits

  • Optical, non-destructive, non-contact
  • Real sample monitoring
  • Fast Measurement (400 points / 40 sec)
  • Easy operation / Auto-focusing
  • 2D & 3D Mapping

Thickness Measurements:

ST2000-DLXn

Fast Measurement & Easy Operation Non-contact & Non-destructive Superb Repeatability & Reproducibility Windows based user-friendly interface Print function of each view & data saving.

More Info

Ask for a quote

ST4000 SERIES

Fast Measurement & Easy Operation Non-contact & Non-destructive Superb Repeatability & Reproducibility Windows based user-friendly interface Print function of each view & data saving.

More Info

Ask for a quote

ST5000 SERIES

All capability of ST2000 & more precision measurement.
More Info

Ask for a quote


OSP Measurements

ST2080-OSP

Optical Organic Solder Preservative OSP Thickness Measurement.
More Info

Ask for a quote


Spectrometer:

Spectra Academy

Spectra Academy consists of a spectrometer (detector), light source, cuvette holder and other…

More Info

Ask for a quote


Other equipments:

Spectral Ellipsometry System

Thickness measurement of ultra-thin film and refractive index after…

More Info

Ask for a quote

MEIS-K120

Medium Energy Ion Scattering MEIS K120 For Surface Analysis.
More Info

Ask for a quote

Defect Inspection Equipment

Advanced Spectral Defect Detection and Metrology.
More Info

Ask for a quote

Profilometer

Silicon wafer flatness, Transparent film on transparent substrate, Thin film thickness 3D Profilometry…

More Info

Ask for a quote