Optical Measurements Systems

Full range of systems for the optical analysis of thin film, wafers and solar cells, ranging from thickness measurements to 3D profiling to colour measurement. Completely integrated systems, wide range of models & prices, non-destructive measurements. From R&D to the product lines, each application will find its specific instrument: semiconductor, biotech, solar, LCD.

Benefits

  • Optical, non-destructive, non-contact
  • Real sample monitoring
  • Fast Measurement (400 points / 40 sec)
  • Easy operation / Auto-focusing
  • 2D & 3D Mapping

Thickness Measurements:

ST2000-DLXn

Fast Measurement & Easy Operation Non-contact & Non-destructive Superb Repeatability & Reproducibility Windows based user-friendly interface Print function of each view & data saving.

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ST4000 SERIES

Fast Measurement & Easy Operation Non-contact & Non-destructive Superb Repeatability & Reproducibility Windows based user-friendly interface Print function of each view & data saving.

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ST5000 SERIES

All capability of ST2000 & more precision measurement.
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OSP Measurements

ST2080-OSP

Optical Organic Solder Preservative OSP Thickness Measurement.
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Spectrometer:

Spectra Academy

Spectra Academy consists of a spectrometer (detector), light source, cuvette holder and other…

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Other equipments:

Spectral Ellipsometry System

Thickness measurement of ultra-thin film and refractive index after…

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MEIS-K120

Medium Energy Ion Scattering MEIS K120 For Surface Analysis.
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Defect Inspection Equipment

Advanced Spectral Defect Detection and Metrology.
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Profilometer

Silicon wafer flatness, Transparent film on transparent substrate, Thin film thickness 3D Profilometry…

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