Full range of systems for the optical analysis of thin film, wafers and solar cells, ranging from thickness measurements to 3D profiling to colour measurement. Completely integrated systems, wide range of models & prices, non-destructive measurements. From R&D to the product lines, each application will find its specific instrument: semiconductor, biotech, solar, LCD.
Optical, non-destructive, non-contact
Real sample monitoring
Fast Measurement (400 points / 40 sec)
Easy operation / Auto-focusing
2D & 3D Mapping
Fast Measurement & Easy Operation Non-contact & Non-destructive Superb Repeatability & Reproducibility Windows based user-friendly interface Print function of each view & data saving.