Optical Measurements Systems
Benefits
- Optical, non-destructive, non-contact
- Real sample monitoring
- Fast Measurement (400 points / 40 sec)
- Easy operation / Auto-focusing
- 2D & 3D Mapping
Thickness Measurements:

ST2000-DLXn
Fast Measurement & Easy Operation Non-contact & Non-destructive Superb Repeatability & Reproducibility Windows based user-friendly interface Print function of each view & data saving.

ST4000 SERIES
Fast Measurement & Easy Operation Non-contact & Non-destructive Superb Repeatability & Reproducibility Windows based user-friendly interface Print function of each view & data saving.

OSP Measurements

Spectrometer:

Spectra Academy
Spectra Academy consists of a spectrometer (detector), light source, cuvette holder and other…
Other equipments:

Spectral Ellipsometry System
Thickness measurement of ultra-thin film and refractive index after…


Defect Inspection Equipment
Advanced Spectral Defect Detection and Metrology.
More Info

Profilometer
Silicon wafer flatness, Transparent film on transparent substrate, Thin film thickness 3D Profilometry…