Four Point Probe Manual + Test Units
Manual Four Point Probe and Test Units for Semiconductor Resistivity
Manual four point probe configurations and test units provide flexible resistivity measurement capabilities for research and characterization laboratories where measurement control and sample handling are managed by technical staff. These systems support precise contact placement and adaptability across wafer types, enabling targeted evaluation of material properties during early process development and comparative studies.
Designed for straightforward deployment, manual systems allow customization of measurement sequences and are appropriate for labs prioritizing flexibility and low-volume workflows.
Typical Use Cases
Manual four point probe units are suitable when:
- flexible measurement setup is required
- R&D or material evaluation workflows demand operator-controlled sampling
- variable wafer sizes and sample types are evaluated
- Throughput is low to moderate
- Materials science such as wafers, ingots, films and conductive coatings
- Calculating coating thickness
- Resistivity determination across defined sample zones
- Manual control of probe positioning and contact conditions
Measurement Capabilities
- Current sources 10 nA to 100 mA. Compliance voltage 0 to 50 V.
- Samples sizes from 10mm to 250mm
These configurations enable targeted resistivity characterization aligned with laboratory evaluation needs.
Equipments
Multi Height Four Point Probe
hard anodised aluminium base 250mm wide, 290mm deep,and a height of 200mm
Multi Height Microposition Probe Stand
The Multiheight Probe stand with micrometer controlled X-Y stage
Hand Applied Four Point Probe
A solution for making measurements where portability is a key factor
Multiposition Wafer Probe
One size for wafers up to 150mm diameter and the second for wafers up to 200mm diameter
Universal Probe Station
Highly repeatable needle contact conditions. Custom adjustable needle loadings
Test Units
We supply three Test Units designed specifically for four point probe measurements.
Probe Heads Settings
We can do specifics settings on probe heads depending on samples type
- Tip radius of 12.5µm to 500µm
- TipSpacing : 1mm, 1.591mm, 0.625mm
- Preload settings from 10g to 200g
MDC Europe Support
MDC Europe ensures manual systems are configured for measurement stability and repeatability appropriate to R&D and characterization workflows. Support includes installation guidance and application advice to optimize performance.
Why to Choose Our Products?
- OEM-level refurbishment meeting original specifications
- 30+ years of experience in semiconductor solutions
- Fast European delivery and support
- Comprehensive product portfolio from spares to systems
- Trusted by leading OEMs and research institutes