Parametric Tester
Parametric Testing Solutions: Precision, Speed & Scalability
Parametric testing is where semiconductor quality begins. Whether you’re characterizing new devices, monitoring process drift, or validating production yield, having the right parametric test infrastructure is critical — and increasingly, legacy systems are holding fabs back.
MDC Europe distributes best-in-class parametric analyzers and software, combining proven solutions with next-generation innovations designed for 200mm and 300mm fabs.
DC Parametric Analysers — Reedholm
Precision parametric testing made simple — fast, scalable, and built for the future of semiconductor innovation.
The Reedholm DC Parametric Analyzer delivers accurate, high-speed testing in a modular architecture that grows with your needs. From R&D to high-volume production, it integrates seamlessly with probers, handlers, and thermal control systems.
Key Features:
- Modular & Expandable — Five flexible platforms that scale with your requirements
- High Precision — Accurate DC parametric measurements at production speeds
- Versatile Instrumentation — Bias supplies, multimeters, CMU, HV/HC modules, pulse generators
- Advanced Switching — Low-noise, Kelvin-guarded connections for reliable DUT measurements
- Powerful Software — Test plan creation, device characterization, automated data gathering & graphical analysis
- Seamless Integration — Compatible with automatic probers, handlers, and wafer-level reliability testing
- Reliable & Maintainable — Built-in diagnostics, calibration, and global technical support
Next-Generation E-Test System
For fabs bringing on new 200mm/300mm capacity — or replacing aging, unsupported systems — MDC Europe offers access to a patented, production-focused parametric test platform that redefines what’s possible.
What makes it different:
- A complete system per probe pad — SMU, CMU, matrix, pulse generator, all inherently parallel
- 24-bit measurement performance — On par with or exceeding Keysight, Keithley, and legacy Reedholm systems
- 10x lower cost of test — Same production-grade specs, dramatically reduced investment
- Zero tester footprint — Compact test head, replaceable cards, minimal maintenance
- Faster data acquisition — Parallel testing eliminates the bottlenecks of traditional sequential systems
- No long analog cables — Test equipment positioned inches from the probe card, eliminating parasitic elements that degrade measurement accuracy
- Test plan compatibility — Built-in emulator supports existing Keysight/Agilent and Keithley test plans for a smooth transition
Interested? We recommend a short 15-minute introduction call. If it fits your roadmap, we can follow up under mutual NDA with a full technical review.
MDC Europe Capability
MDC Europe is more than a distributor — we are a hands-on technical partner in the semiconductor ecosystem.
- Deep application knowledge — We speak the language of your engineers, not just sales.
- Curated vendor portfolio — Access to proven, best-in-class solutions without the market noise.
- End-to-end coverage — One reliable contact from parametric testing to final test.
- European proximity — Fast response, local support, on-site expertise. Because downtime is never an option.
Long-term mindset — We grow with your business and your roadmap.
Why to Choose Our Products?
- OEM-level refurbishment meeting original specifications
- 30+ years of experience in semiconductor solutions
- Fast European delivery and support
- Comprehensive product portfolio from spares to systems
- Trusted by leading OEMs and research institutes