The Multiheight Probe stand with micrometer controlled X-Y stage as a solution for measurements on sample sizes from several mm square up to 300mm.
Multiheight Microposition Probe Stand
The X-Y microposition table can be easily added when measurement of small samples is desired. With only four screws to undo it is easily removed, so that large samples up to 300mm diameter or ingots up to 250mm high can be accommodated (thicker samples can be accommodated on request).
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Max. sample size |
Samples up to 250mm diameter (300mm option at no extra cost) |
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Max. sample thickness |
Samples up to 250mm high can be measured (higher on request) |
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Microswitch |
Prevents current flow when probe is not in contact with the sample |
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Manual Control |
Simple lever operation for probe contact and removal |
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Simple set up |
Single wire connects the probe stand and electronics |
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X-Y Stage |
Offers micrometer controlled manipulation of small samples |
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Automation |
Optional automated z-motion is available |
System Configuration
Component parts:
A.Measurement Base – 1pc
B.Multiheight assembly – 1pc
C.Multiheight Column – 1pc
D.Four point probe head – 1pc
E.Connecting cable – 1pc
F.Micrometer table – 1pc for samples up to 76mm diameter (removable)
System Footprint
A. Multiheight Base: 250mm W x 290mm L x 8mm H (320mm x 370mm x 8mm option)
B. Multiheight Probe assembly: 60mm W x 280mm L x 80mm H (60mm x 330mm x 80mm option)
