Four Point Probe Resistivity Measurements
- Surface access measures resistance, thickness
- Adapted stations support specific metrology needs
- Operator efficiency and cost reduction
- Enhanced user confidence
- Faster and accurate results
- Ease of measurements
- Appropriate capacity for any study completion
Automatic Four Point Probe Arm option motorized Z motion arm
The Multiheight Probe station with an automatic Z motion (AFPP) for use in making four point probe measurements.
Multi Height Four Point Probe
It consists of a hard anodised aluminium base 250mm wide, 290mm deep and 8mm thick. A column of stainless steel with a 19mm diameter…
Microposition Probe Stand
The Multiheight Probe stand with micrometer controlled X-Y stage as a solution for measurements on sample sizes from several mm square up to 300mm.
Multiposition Wafer Probe
The probe is available in two sizes at the same cost. One size is for wafers up to 150mm diameter and the second for wafers up to 200mm diameter. More Info
Universal Probe Station
Highly repeatable needle contact conditions. Custom adjustable needle loadings which directly indicate the set load.
RM3000 Test Unit
Current Range : 10nA-100mA.
Current Range : 1uA-10mA.
HM21 Portable Four Point Probe Test Meter
Current Range : 100nA-10mA.
Tensormeter Model RTM1
Sheet and Hall resistance measurements: automated, ultra-precise, offset-free. Download “Best Possible Resistance Measurements” here.
Four Point Probe Heads
Compact Probe Head
For use on Veeco FPP50000 and FPP100 equipment. It is also suitable for use on GRQ equipment or to replace square bodied probe heads manufactured by Alessi.
Cylindrical Four Point Probe Head
Jandel Engineering Limited manufactures the cylindrical four point probe head to be compatible with the Jandel Multiposition Wafer Probe, the Microposition Probe, the Multiheight Probe,…
Hand Applied Four Point Probe
A solution for making measurements where portability is a key factor. The system can be used for measuring a wide variety of samples from thin layers and wafers up to large ingots.
Probes for Prometrix KLA/Tencor
Manufactured with 6-way connector probe head to be compatible with systems manufactured by KLA/ Tencor (formerly Prometrix).
Probes for Prometrix CDE
Manufactured with 6-way connector probe head to be compatible with systems manufactured by CDE, Creative Design Engineering.
Miniature Catridge Probe Head with Positioning Key
Manufactured with positioning key for use on older Napson and Kokusai equipment.
Miniature Catridge Probe with 6-32/M3 Mounting Holes
For use on AIT equipment. The 6-32 or M3 mounting holes also make it suitable for use in customers’ own stands.
Catridge with lead Probe Head
For use on customer ’s own equipment, some Veeco equipment, or where an A&M Fell style probe has previously been used.
Catridge Probe With 4-Pin Connector Mounting
For use on Napson equipment or older Keithley-Omega equipment.
Low Profile Probe for Hall Measurements
For use in making four point probe measurements associated with Hall measurements.
For use at high or low temperatures. The range the probe can be used in an oven is approximately 80K to 600K.
Hi-Vac Cylindrical Four Point Probe Head
A version of the cylindrical probe which can be used at high vacuum.
Automatic Mapping Four Point Probes Resistivity Measurements
- Measurement efficiency , consistency
- Adapted for Wafer and Solar application
- Cost reduction by using our laboratory equipment
The entry-level model of the AIT four point measuring systems family.
The CMT SR2000 is a completely automated, mapping four point measuring system. It offers precise and fiable mapping measurements of resistivity and sheet resistance.
Sheet Resistance & Resistivity Measuring System (Four Point Probe System for Glass).
Sheet Resistance & Resistivity Measuring System (Four Point Probe System for 12″ Wafer).
Miniature Catridge Four Point Probe Head
PRECISION 4-POINT RESISTIVITY PROBE HEADS