Capacitance And Current Voltage (C-V I-V) Analysis Systems
Complete line of systems & software for CV, conductance, IV, gate integrity, doping profile, TVS Customizable with a wide range of meters (agilent, keithley, HP) modulable, complete & powerful analysis software packages. Some of the users of the MDC CSM.Win systems monitor critical processing steps for contamination and material quality.
Surface access measures resistance, thickness
Adapted stations support specific metrology needs
Operator efficiency and cost reduction
Whether you require a simple C-V plotter to measure mobile ion contamination or an advanced system to measure multi-frequency C-V, I-V, TVS, or gate oxide integrity, Materials Development Corporation…
This model provides unique capabilities for advanced MOS device measurements. Proportionally controlled direct current heating provides the most electrically quiet environment for high sensitivity capacitance and current measurements.
MDC MERCURY PROBES are precision instruments that enable rapid, convenient, and non-destructive measurements of semiconductor samples by probing wafers with mercury to form contacts of well-defined area.