A solution for making measurements where portability is a key factor. The system can be used for measuring a wide variety of samples from thin layers and wafers up to large ingots.
Hand Applied Probe
The probe head can have loads of up to 200g per needle and the Hand Applied Probe has a large downward force of around 1.2Kg and so is not suitable for fragile unsupported samples. As a scale for size the main image above shows the Hand Applied Probe sitting on top of a 150mm silicon ingot.
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Max. sample size |
Any reasonable size sample can be measured as long as the Hand |
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Max. sample thickness |
Any thickness of sample can be measured as long as the Hand |
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Toggle Switch |
Prevents current flow when probe is not in contact with the sample |
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Manual Placement |
Probe is designed to be placed and left while measurement is made |
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Simple set up |
Single wire connects the Hand Applied Probe and measurement |
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